Biblio

Found 3 results

2003
2001
Vandooren, A., J. F. Conley, S. Cristoloveanu, M. Mojarradi, and E. Kolawa, "Degradation mechanisms in SOI n-channel LDMOSFETs", Microelectronic Engineering, vol. 59, issue 1-4, pp. 489 - 495, 11/2001. Abstract