Biblio

Found 3 results

2002
2001
Wang, B., J. S. Suehle, E. M. Vogel, J. F. Conley, C. E. Weintraub, A. H. Johnston, and J. B. Bernstein, "Latent reliability degradation of ultra-thin oxides after heavy ion and γ-ray irradiation", IEEE 2001 International Integrated Reliability Workshop (IRW), Lake Tahoe, CA, IEEE, pp. 16 - 19, 10/2001. Abstract