Biblio

Found 2 results

2001
, , , 12/2001.
Conley, J. F., J. S. Suehle, A. H. Johnston, B. Wang, T. Miyahara, E. M. Vogel, and J. B. Bernstein, "Heavy-ion-induced soft breakdown of thin gate oxides", IEEE Transactions on Nuclear Science, vol. 48, issue 6, pp. 1913 - 1916, 12/2001. Abstract