Biblio

Found 3 results

1984
Geib, K. M., S. M. Goodnick, D. Y. Lin, R. G. Gann, C. W. Wilmsen, and J. F. Wager, "Influence of interfacial structure on the electronic properties of SiO2/InP MISFET’s", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 2, issue 3, pp. 516, 1984. Abstract
1983
Wager, J. F., K. M. Geib, C. W. Wilmsen, and L. L. Kazmerski, "Native oxide formation and electrical instabilities at the insulator/InP interface", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 1, issue 3, pp. 778, 1983. Abstract