OREGON STATE UNIVERSITY

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Biblio

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Filters: Author is Geib, K. M.  [Clear All Filters]
1984
Geib, K. M., S. M. Goodnick, D. Y. Lin, R. G. Gann, C. W. Wilmsen, and J. F. Wager, "Influence of interfacial structure on the electronic properties of SiO2/InP MISFET’s", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 2, issue 3, pp. 516, 1984.
1983
Wager, J. F., K. M. Geib, C. W. Wilmsen, and L. L. Kazmerski, "Native oxide formation and electrical instabilities at the insulator/InP interface", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 1, issue 3, pp. 778, 1983.
Wilmsen, C. W., J. F. Wager, K. M. Geib, T. Hwang, and M. Fathipour, "Traps at the deposited insulator-InP interface — a discussion of a possible cause", Thin Solid Films, vol. 103, issue 1-3, pp. 47 - 52, 1983.