Biblio

Found 7 results

2005
2004
2003
Dautrich, M., P. M. Lenahan, A. Y. Kang, and J. F. Conley, "Non-invasive nature of corona charging on thermal Si/SiO2 structures", IEEE 2003 International Integrated Reliability Workshop (IRW), Lake Tahoe, CA, IEEE, pp. 7 - 9, 10/2003. Abstract
2002
2000
Conley, J. F., P. M. Lenahan, and W. F. McArthur, "First-Order Defect Precursor Formation Kinetics for a Predictive Model of Oxide Charging", Journal of Radiation Effects, Research, and Engineering, vol. 18, 2000.