Biblio

Found 1 results

2009
Triska, J., J. F. Conley, R. Presley, and J. F. Wager, "Bias Stability of Zinc-Tin-Oxide Thin Film Transistors with Al2O3 Gate Dielectrics", IEEE International Integrated Reliability Workshop (IRW), South Lake Tahoe, CA, IEEE, pp. 86 - 89, 10/2009. Abstract