OREGON STATE UNIVERSITY

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Biblio

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Filters: Author is Ryan, Jason T.  [Clear All Filters]
2009
Lenahan, P. M., J. T. Ryan, C. J. Cochrane, and J. F. Conley, "Defects in HfO2 Based Dielectric Gate Stacks", MRS Proceedings, vol. 1155, pp. 1-6, 01/2009.