Biblio

Found 2 results

2003
Kang, A. Y., P. M. Lenahan, J. F. Conley, and Y. Ono, "Reliability Concerns for HfO2/Si (and ZrO2/Si) Systems: Interface and Dielectric Traps", IEEE 2003 International Integrated Reliability Workshop (IRW), Lake Tahoe, CA, IEEE, pp. 24 - 27, 10/2003. Abstract
2002
Kang, A. Y., P. M. Lenahan, and J. F. Conley, "Reliability Concerns for HfO2/Si Devices: Interface and Dielectric Traps", IEEE International Integrated Reliability Workshop (IRW), Lake Tahoe, CA, IEEE, pp. 102 - 107, 10/2002. Abstract