OREGON STATE UNIVERSITY

You are here

Biblio

Found 1 results
Filters: Author is T. Meyers  [Clear All Filters]
2000
Suehle, J. S., T. Meyers, and J. F. Conley, "The Effects of Ionizing Radiation on Wear-Out and Reliability of Thin Gate Oxides", 2000 IEEE Microelectronics and Reliability and Qualification Workshop, 11/2000.