Biblio

Found 92 results

2012
2011
Murali, S., J. S. Rajachidambaram, S. - Y. Han, C. - H. Chang, G. S. Herman, and J. F. Conley, "Bipolar resistive switching of zinc-tin-oxide resistive random access memory", IEEE 11th International Conference on Nanotechnology (IEEE-NANO), Portland, OR, IEEE, pp. 740 - 743, 08/2011. Abstract
Waggoner, T., J. Triska, K. Hoshino, J. F. Wager, and J. F. Conley, "Zirconium oxide-aluminum oxide nanolaminate gate dielectrics for amorphous oxide semiconductor thin-film transistors", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 29, issue 4, pp. 04D115, 07/2011. Abstract
2010
Conley, J. F., "Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors", IEEE Transactions on Device and Materials Reliability, vol. 10, issue 4, pp. 460 - 475, 12/2010. Abstract
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Alimardani, N., J. F. Conley, E. W. Cowell, J. F. Wager, M. Chin, S. Kilpatrick, and M. Dubey, "Stability and bias stressing of metal/insulator/metal diodes", 2010 IEEE International Integrated Reliability Workshop (IIRW), S. Lake Tahoe, CA, IEEE, pp. 80 - 84, 10/2010. Abstract
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Triska, J., J. F. Conley, R. E. Presley, and J. F. Wager, "Bias stress stability of zinc-tin-oxide thin-film transistors with Al2O3 gate dielectrics", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 28, issue 4, pp. C5I1, 07/2010. Abstract
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2009
Smith, S. W., K. G. McAuliffe, and J. F. Conley, "Atomic Layer Deposited Al2O3/Ta2O5 Nanolaminate Capacitors", 2009 International Semiconductor Device Research Symposium (ISDRS), College Park, MD, IEEE, pp. 1 - 2, 12/2009. Abstract
Mason, A. D., T. F. Roberts, J. F. Conley, D. T. Price, D. D. J. Allman, and M. S. McGuire, "Investigation of growth parameter influence on hydrothermally grown ZnO nanowires using a research grade microwave", 2009 IEEE International Semiconductor Device Research Symposium (ISDRS), College Park, MD, IEEE, pp. 1 - 2, 12/2009. Abstract
Pelatt, B. D., C. - C. Huang, and J. F. Conley, "ZnO Nanobridge Devices Fabricated on Carbonized Photoresist", 2009 International Semiconductor Device Research Symposium (ISDRS), College Park, MD, IEEE, pp. 1 - 2, 12/2009. Abstract
Triska, J., J. F. Conley, R. Presley, and J. F. Wager, "Bias Stability of Zinc-Tin-Oxide Thin Film Transistors with Al2O3 Gate Dielectrics", IEEE International Integrated Reliability Workshop (IRW), South Lake Tahoe, CA, IEEE, pp. 86 - 89, 10/2009. Abstract
Conley, J. F., "Instabilities in oxide semiconductor transparent thin film transistors", 2009 IEEE International Integrated Reliability Workshop (IRW), South Lake Tahoe, CA, IEEE, pp. 50 - 55, 10/2009. Abstract
2006
Green, J. M., T. Gutu, L. Dong, J. Jiao, J. F. Conley, and Y. Ono, "Electron Microscopy Characterization of Al2O3 and ZnO Coated Carbon Nanotubes", Microscopy and Microanalysis, vol. 12, issue S02, pp. 676-677, 08/2006.
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Goncher, G., R. Solanki, J. R. Carruthers, J. F. Conley, and Y. Ono, "p-n junctions in silicon nanowires", Journal of Electronic Materials, vol. 35, issue 7, pp. 1509 - 1512, 07/2006. Abstract