Biblio

Found 4 results

2012
2011
2010
Alimardani, N., J. F. Conley, E. W. Cowell, J. F. Wager, M. Chin, S. Kilpatrick, and M. Dubey, "Stability and bias stressing of metal/insulator/metal diodes", 2010 IEEE International Integrated Reliability Workshop (IIRW), S. Lake Tahoe, CA, IEEE, pp. 80 - 84, 10/2010. Abstract
, , , 01/2011, 2010.