Oregon State University

Biblio

Found 9 results

2010
Triska, J., J. F. Conley, R. E. Presley, and J. F. Wager, "Bias stress stability of zinc-tin-oxide thin-film transistors with Al2O3 gate dielectrics", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 28, issue 4, pp. C5I1, 07/2010. Abstract
2009
2008
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2004
Presley, R. E., C. L. Munsee, C. - H. Park, D. Hong, J. F. Wager, and D. A. Keszler, "Tin oxide transparent thin-film transistors", Journal of Physics D: Applied Physics, vol. 37, issue 20, pp. 2810 - 2813, 10/2004. Abstract

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