OREGON STATE UNIVERSITY

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Filters: Author is Erslev, Peter T.  [Clear All Filters]
2008
Erslev, P. T., H. Q. Chiang, D. Hong, J. F. Wager, and D. J. Cohen, "Electronic properties of amorphous zinc tin oxide films by junction capacitance methods", Journal of Non-Crystalline Solids, vol. 354, issue 19-25, pp. 2801 - 2804, 05/2008.