OREGON STATE UNIVERSITY

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Biblio

Found 4 results
Filters: Author is Hoshino, Ken  [Clear All Filters]
2012
Wager, J. F., K. Hoshino, E. S. Sundholm, R. E. Presley, R. Ravichandran, C. C. Knutson, D. A. Keszler, R. L. Hoffman, D. A. Mourey, and J. Robertson, "A framework for assessing amorphous oxide semiconductor thin-film transistor passivation", Journal of the Society for Information Display, vol. 20, issue 10, pp. 589 - 595, 10/2012.
Best paper of 2012 for the Journal of Information Display
2011
Jiang, K., J. T. Anderson, K. Hoshino, D. Li, J. F. Wager, and D. A. Keszler, "Low-Energy Path to Dense HfO2 Thin Films with Aqueous Precursor", Chemistry of Materials, vol. 23, issue 4, pp. 945 - 952, 02/2011.
2010
Hoshino, K., and J. F. Wager, "Operating Temperature Trends in Amorphous In–Ga–Zn–O Thin-Film Transistors", IEEE Electron Device Letters, vol. 31, issue 8, pp. 818 - 820, 08/2010.
2009
Hoshino, K., D. Hong, H. Q. Chiang, and J. F. Wager, "Constant-Voltage-Bias Stress Testing of a-IGZO Thin-Film Transistors", IEEE Transactions on Electron Devices, vol. 56, issue 7, pp. 1365 - 1370, 05/2009.