Oregon State University

Biblio

Found 11 results

2009
Hoshino, K., D. Hong, H. Q. Chiang, and J. F. Wager, "Constant-Voltage-Bias Stress Testing of a-IGZO Thin-Film Transistors", IEEE Transactions on Electron Devices, vol. 56, issue 7, pp. 1365 - 1370, 05/2009. Abstract
2008
Hong, D., G. Yerubandi, H. Q. Chiang, M. C. Spiegelberg, and J. F. Wager, "Electrical Modeling of Thin-Film Transistors", Critical Reviews in Solid State and Materials Sciences, vol. 33, issue 2, pp. 101 - 132, 4/2008. Abstract
Erslev, P. T., H. Q. Chiang, D. Hong, J. F. Wager, and D. J. Cohen, "Electronic properties of amorphous zinc tin oxide films by junction capacitance methods", Journal of Non-Crystalline Solids, vol. 354, issue 19-25, pp. 2801 - 2804, 05/2008. Abstract
2007
2006
Chiang, H. Q., D. Hong, C. M. Hung, R. E. Presley, J. F. Wager, C. - H. Park, D. A. Keszler, and G. S. Herman, "Thin-film transistors with amorphous indium gallium oxide channel layers", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 24, issue 6, pp. 2702, 2006. Abstract
Hong, D., H. Q. Chiang, and J. F. Wager, "Zinc tin oxide thin-film transistors via reactive sputtering using a metal target", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 24, issue 5, pp. L23, 2006. Abstract
2005

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