Biblio

Found 9 results

2009
2005
, , , 12/2005.
Lenahan, P. M., and J. F. Conley, "Magnetic Resonance Studies of Trapping Centers in High-κ Dielectric Films on Silicon", IEEE Transactions on Device and Materials Reliability, vol. 5, issue 1, pp. 90 - 102, 03/2005. Abstract
2004
, , , 07/2004.
2003
, , , 10/2003.
Kang, A. Y., P. M. Lenahan, J. F. Conley, and Y. Ono, "Reliability Concerns for HfO2/Si (and ZrO2/Si) Systems: Interface and Dielectric Traps", IEEE 2003 International Integrated Reliability Workshop (IRW), Lake Tahoe, CA, IEEE, pp. 24 - 27, 10/2003. Abstract
2002
, , , 12/2002.
Kang, A. Y., P. M. Lenahan, and J. F. Conley, "Reliability Concerns for HfO2/Si Devices: Interface and Dielectric Traps", IEEE International Integrated Reliability Workshop (IRW), Lake Tahoe, CA, IEEE, pp. 102 - 107, 10/2002. Abstract
, , , 08/2002.