Found 3 results

Hong, D., G. Yerubandi, H. Q. Chiang, M. C. Spiegelberg, and J. F. Wager, "Electrical Modeling of Thin-Film Transistors", Critical Reviews in Solid State and Materials Sciences, vol. 33, issue 2, pp. 101 - 132, 4/2008. Abstract
Lenahan, P. M., and J. F. Conley, "Magnetic Resonance Studies of Trapping Centers in High-κ Dielectric Films on Silicon", IEEE Transactions on Device and Materials Reliability, vol. 5, issue 1, pp. 90 - 102, 03/2005. Abstract
Geib, K. M., S. M. Goodnick, D. Y. Lin, R. G. Gann, C. W. Wilmsen, and J. F. Wager, "Influence of interfacial structure on the electronic properties of SiO2/InP MISFET’s", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 2, issue 3, pp. 516, 1984. Abstract