Biblio

Found 3 results

2008
Hong, D., G. Yerubandi, H. Q. Chiang, M. C. Spiegelberg, and J. F. Wager, "Electrical Modeling of Thin-Film Transistors", Critical Reviews in Solid State and Materials Sciences, vol. 33, issue 2, pp. 101 - 132, 4/2008. Abstract
2005
Lenahan, P. M., and J. F. Conley, "Magnetic Resonance Studies of Trapping Centers in High-κ Dielectric Films on Silicon", IEEE Transactions on Device and Materials Reliability, vol. 5, issue 1, pp. 90 - 102, 03/2005. Abstract
1984
Geib, K. M., S. M. Goodnick, D. Y. Lin, R. G. Gann, C. W. Wilmsen, and J. F. Wager, "Influence of interfacial structure on the electronic properties of SiO2/InP MISFET’s", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 2, issue 3, pp. 516, 1984. Abstract