OREGON STATE UNIVERSITY

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Biblio

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Filters: Keyword is bias stressing  [Clear All Filters]
2010
Triska, J., J. F. Conley, R. E. Presley, and J. F. Wager, "Bias stress stability of zinc-tin-oxide thin-film transistors with Al2O3 gate dielectrics", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 28, issue 4, pp. C5I1, 07/2010.
Conley, J. F., "Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors", IEEE Transactions on Device and Materials Reliability, vol. 10, issue 4, pp. 460 - 475, 12/2010.