OREGON STATE UNIVERSITY

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Biblio

Found 2 results
Filters: Keyword is stability  [Clear All Filters]
2010
Conley, J. F., "Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors", IEEE Transactions on Device and Materials Reliability, vol. 10, issue 4, pp. 460 - 475, 12/2010.
2009
Hoshino, K., D. Hong, H. Q. Chiang, and J. F. Wager, "Constant-Voltage-Bias Stress Testing of a-IGZO Thin-Film Transistors", IEEE Transactions on Electron Devices, vol. 56, issue 7, pp. 1365 - 1370, 05/2009.