OREGON STATE UNIVERSITY

You are here

Biblio

Found 3 results
Filters: Keyword is dielectric materials  [Clear All Filters]
2010
Triska, J., J. F. Conley, R. E. Presley, and J. F. Wager, "Bias stress stability of zinc-tin-oxide thin-film transistors with Al2O3 gate dielectrics", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 28, issue 4, pp. C5I1, 07/2010.
2005
Munasinghe, C., J. Heikenfeld, R. Dorey, R. Whatmore, J. P. Bender, J. F. Wager, and A. J. Steckl, "High Brightness ZnS and GaN Electroluminescent Devices Using PZT Thick Dielectric Layers", IEEE Transactions on Electron Devices, vol. 52, issue 2, pp. 194 - 203, 02/2005.
Hong, D., and J. F. Wager, "Passivation of zinc–tin–oxide thin-film transistors", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 23, issue 6, pp. L25, 2005.