OREGON STATE UNIVERSITY

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Biblio

Found 3 results
Filters: Keyword is electron mobility  [Clear All Filters]
2010
Triska, J., J. F. Conley, R. E. Presley, and J. F. Wager, "Bias stress stability of zinc-tin-oxide thin-film transistors with Al2O3 gate dielectrics", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 28, issue 4, pp. C5I1, 07/2010.
2006
Chiang, H. Q., D. Hong, C. M. Hung, R. E. Presley, J. F. Wager, C. - H. Park, D. A. Keszler, and G. S. Herman, "Thin-film transistors with amorphous indium gallium oxide channel layers", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 24, issue 6, pp. 2702, 2006.