OREGON STATE UNIVERSITY

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Biblio

Found 3 results
Filters: Keyword is electron traps  [Clear All Filters]
2010
Triska, J., J. F. Conley, R. E. Presley, and J. F. Wager, "Bias stress stability of zinc-tin-oxide thin-film transistors with Al2O3 gate dielectrics", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 28, issue 4, pp. C5I1, 07/2010.
2000
Bender, J. P., and J. F. Wager, "Alternating-current thin-film electroluminescent device modeling via SPICE Fowler-Nordheim diode", IEEE Transactions on Electron Devices, vol. 47, issue 5, pp. 1113 - 1115, 05/2000.