OREGON STATE UNIVERSITY

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Biblio

Found 2 results
Filters: Keyword is atomic layer deposition (ALD)  [Clear All Filters]
2010
Triska, J., J. F. Conley, R. E. Presley, and J. F. Wager, "Bias stress stability of zinc-tin-oxide thin-film transistors with Al2O3 gate dielectrics", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 28, issue 4, pp. C5I1, 07/2010.
2005
Conley, J. F., L. Stecker, and Y. Ono, "Directed Integration of ZnO Nanobridge Devices on a Si Substrate", Applied Physics Letters, vol. 87, issue 22, pp. 223114, 11/2005.