Found 2 results

Erslev, P. T., H. Q. Chiang, D. Hong, J. F. Wager, and D. J. Cohen, "Electronic properties of amorphous zinc tin oxide films by junction capacitance methods", Journal of Non-Crystalline Solids, vol. 354, issue 19-25, pp. 2801 - 2804, 05/2008. Abstract
Lenahan, P. M., and J. F. Conley, "Magnetic Resonance Studies of Trapping Centers in High-κ Dielectric Films on Silicon", IEEE Transactions on Device and Materials Reliability, vol. 5, issue 1, pp. 90 - 102, 03/2005. Abstract