OREGON STATE UNIVERSITY

You are here

Biblio

Found 3 results
Filters: Keyword is amorphous oxide semiconductor (AOS)  [Clear All Filters]
2010
Conley, J. F., "Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors", IEEE Transactions on Device and Materials Reliability, vol. 10, issue 4, pp. 460 - 475, 12/2010.
2009
Hoshino, K., D. Hong, H. Q. Chiang, and J. F. Wager, "Constant-Voltage-Bias Stress Testing of a-IGZO Thin-Film Transistors", IEEE Transactions on Electron Devices, vol. 56, issue 7, pp. 1365 - 1370, 05/2009.
Heineck, D. P., B. R. McFarlane, and J. F. Wager, "Zinc Tin Oxide Thin-Film-Transistor Enhancement/Depletion Inverter", IEEE Electron Device Letters, vol. 30, issue 5, pp. 514 - 516, 05/2009.