OREGON STATE UNIVERSITY

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Biblio

Found 8 results
Filters: Author is Ono, Yoshi  [Clear All Filters]
2003
Kang, A. Y., P. M. Lenahan, J. F. Conley, and Y. Ono, "Reliability Concerns for HfO2/Si (and ZrO2/Si) Systems: Interface and Dielectric Traps", IEEE 2003 International Integrated Reliability Workshop (IRW), Lake Tahoe, CA, IEEE, pp. 24 - 27, 10/2003.
Gao, W., J. F. Conley, and Y. Ono, "Stacked Metal Layers as Gates for MOSFET Threshold Voltage Control", MRS Proceedings, vol. 765, pp. 3-8, 01/2003.