OREGON STATE UNIVERSITY

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Biblio

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Filters: Author is Walker, H.  [Clear All Filters]
2000
McNeil, W., J. F. Conley, and H. Walker, "2-D Imaging of Trapped Charge in SiO2 Using Kelvin Probe Force Microscopy", 2000 IEEE International SOI Conference, Wakefield, MA, IEEE, pp. 38 - 39, 10/2000.