OREGON STATE UNIVERSITY

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Biblio

Found 4 results
Filters: Author is Lenahan, Patrick M.  [Clear All Filters]
2009
Lenahan, P. M., J. T. Ryan, C. J. Cochrane, and J. F. Conley, "Defects in HfO2 Based Dielectric Gate Stacks", MRS Proceedings, vol. 1155, pp. 1-6, 01/2009.
2005
Lenahan, P. M., and J. F. Conley, "Magnetic Resonance Studies of Trapping Centers in High-κ Dielectric Films on Silicon", IEEE Transactions on Device and Materials Reliability, vol. 5, issue 1, pp. 90 - 102, 03/2005.
2003
Kang, A. Y., P. M. Lenahan, J. F. Conley, and Y. Ono, "Reliability Concerns for HfO2/Si (and ZrO2/Si) Systems: Interface and Dielectric Traps", IEEE 2003 International Integrated Reliability Workshop (IRW), Lake Tahoe, CA, IEEE, pp. 24 - 27, 10/2003.
2002
Kang, A. Y., P. M. Lenahan, and J. F. Conley, "Reliability Concerns for HfO2/Si Devices: Interface and Dielectric Traps", IEEE International Integrated Reliability Workshop (IRW), Lake Tahoe, CA, IEEE, pp. 102 - 107, 10/2002.