OREGON STATE UNIVERSITY

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ENOB calculation for ADCs with input-correlated quantization error using a sine-wave test

TitleENOB calculation for ADCs with input-correlated quantization error using a sine-wave test
Publication TypeConference Paper
Year of Publication2010
AuthorsWeaver, S. T., B. P. Hershberg, and U. Moon
Conference Name2010 International Conference on Microelectronics (ICM)
Pagination5 - 8
Date Published12/2010
PublisherIEEE
Conference LocationCairo, Egypt
ISBN Number978-1-61284-149-6
Abstract

The equation for calculating ENOB from SNDR of a sine-wave test is only accurate when noise is uncorrelated to the input. In this paper, the equation for calculating ENOB from SNDR is derived for an ideal and a uniform stochastic ADC. The result of these derivations shows that calculating ENOB from SNDR using the conventional equation causes a better-than-actual result in the case a uniform stochastic ADC.

DOI10.1109/ICM.2010.5696205