OREGON STATE UNIVERSITY

You are here

Transient Simulation of Radiation-Induced Charge Trapping and Interface Trap Formation Using a Three-Carrier Transport Model for Silicon Dioxide

TitleTransient Simulation of Radiation-Induced Charge Trapping and Interface Trap Formation Using a Three-Carrier Transport Model for Silicon Dioxide
Publication TypeJournal Article
Year of Publication2000
AuthorsMilanowski, R. J., M. P. Pagey, L. W. Massengill, J. F. Conley, R. D. Schrimpf, and K. F. Galloway
JournalJournal of Radiation Effects, Research, and Engineering
Volume18
Date Published2000