OREGON STATE UNIVERSITY

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The Effects of Ionizing Radiation on Wear-Out and Reliability of Thin Gate Oxides

TitleThe Effects of Ionizing Radiation on Wear-Out and Reliability of Thin Gate Oxides
Publication TypeConference Paper
Year of Publication2000
AuthorsSuehle, J. S., T. Meyers, and J. F. Conley
Conference Name2000 IEEE Microelectronics and Reliability and Qualification Workshop
Date Published11/2000