Electroluminescence thermal quenching in SrS:Cu thin-film electroluminescent devices

TitleElectroluminescence thermal quenching in SrS:Cu thin-film electroluminescent devices
Publication TypeJournal Article
Year of Publication2000
AuthorsBaukol, B. A., J. C. Hitt, P. D. Keir, and J. F. Wager
JournalApplied Physics Letters
Volume76
Issue2
Pagination185
Date Published2000
ISSN00036951
Keywordsbrightness, copper, digital simulation, electroluminescence, electroluminescent devices, radiation quenching, space charge, strontium compounds, thin film devices
Abstract

Electroluminesence (EL) thermal quenching refers a reduction in luminance, concomitant with a reduction in transferred charge, when an alternating-current thin-film electroluminescent (ACTFEL) device is operated at an elevated temperature. EL thermal quenching is found to be significant in SrS:Cu ACTFEL devices operated above ~60-80 °C. Maximum transferred charge-maximum applied voltage (Qmax-Vmax) and transferred charge capacitance (i.e., dQmax /dVmax vs Vmax) measurements as a function of temperature in conjunction with ACTFEL device simulation are employed in order to establish that EL thermal quenching arises from a thermally activated annihilation of positive space charge and a corresponding increase in the threshold voltage.

DOI10.1063/1.125697
Short TitleAppl. Phys. Lett.