Relaxation charge anomalies in the charge–voltage characteristics of alternating-current thin-film electroluminescent devices

TitleRelaxation charge anomalies in the charge–voltage characteristics of alternating-current thin-film electroluminescent devices
Publication TypeJournal Article
Year of Publication1996
AuthorsKeir, P. D., H. Le, R. L. Thuemler, J. C. Hitt, and J. F. Wager
JournalApplied Physics Letters
Volume69
Issue16
Pagination2421
Date Published1996
ISSN00036951
Keywordsalternating current, display devices, electroluminescence, manganese additions, phosphors, relaxation, thin films, zinc sulfides
Abstract

Anomalous charge–voltage (Q–V) characteristics are observed for several types of alternating‐current thin‐film electroluminescent (ACTFEL) devices. These Q–V curves are anomalous because conduction charge flows in these devices exclusively during the portion of the wave form in which the applied voltage is constant, at its maximum value; this kind of conduction charge is denoted relaxation charge. In a normal ACTFEL device, most of the conduction charge flows during the portion of the wave form in which the applied voltage increases with time. The anomalous Q–V characteristics are attributed to insulator leakage for the devices tested. Simulation shows that such anomalous behavior may arise from either insulator or phosphor leakage

DOI10.1063/1.117657
Short TitleAppl. Phys. Lett.