OREGON STATE UNIVERSITY

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Electrical characterization and modeling of alternating-current thin-film electroluminescent devices

TitleElectrical characterization and modeling of alternating-current thin-film electroluminescent devices
Publication TypeJournal Article
Year of Publication1992
AuthorsDavidson, J. D., J. F. Wager, R. I. Khormaei, C. N. King, and R. Williams
JournalIEEE Transactions on Electron Devices
Volume39
Issue5
Pagination1122 - 1128
Date Published05/1992
ISSN00189383
Keywordscapacitance, electroluminescent displays, equivalent circuits, II-VI semiconductors, manganese, semiconductor device models, zinc compounds
Abstract

Electrical characterization of evaporated ZnS:Mn alternating-current thin-film electroluminescent (ACTFEL) devices is accomplished by capacitance-voltage (C-V) analysis. Interpretation of these C-V characteristics is aided by SPICE modeling and by electrical characterization of an ideal ACTFEL device constructed from discrete components, based on a simple equivalent circuit for the ACTFEL device. Various features of the C-V curve are ascribed to equivalent circuit parameters and associated device physics parameters

DOI10.1109/16.129092
Short TitleIEEE Trans. Electron Devices