Journal Papers

• L. Forbes, C. W. Zhang, B. L. Zhang and I. Chandra, "Comparison of Phase Noise Simulation Techniques on a BJT LC Oscillator," IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, vol. 50, no. 6, pp. 716-719, 2003.
• C.W. Zhang, X.Y. Wang, and L. Forbes, "l/f Noise and Timing Jitter in Electronic Oscillators," IEE Proceedings G – Circuits, Devices and Systems, vol.151, No.4, pp. 184-189, April 2004.
• L. Forbes, C. W. Zheng and B.L. Zhang, "Experimental Verification of the Dependence of Bipolar Transistor Flicker Noise on Power Dissipation," IEEE Trans. on Electron Devices, vol. 49, no. 5, pp. 945-46, 2002.
• J. Zhou, M. Cheng and L. Forbes, "Spice Models for Flicker noise in P-MOSFET'S in the Saturation Region," IEEE Trans. on Computer Aided Design (TCAD), vol. 20, no. 6, pp. 763-767, June 2001.
• D. Xie, M. Cheng and L. Forbes, "Spice Models for Flicker Noise in N-MOSFET's from Subthreshold to Strong Inversion," IEEE Trans. on Computer Aided Design (TCAD), vol. 19, no. 11, pp. 1293-1303, Nov. 2000.
• D. Xie and L. Forbes, "Phase Noise Effect on a 2 GHz CMOS LC Oscillator," IEEE Trans. on Computer Aided Design (TCAD), vol. 19, pp. 773-778, July 2000.
• L. Forbes, M. Cheng and J. Zhou, "Simulation of Phase Noise Generated by White Noise in 1.7 GHz CMOS LC Oscillator," IEEE Electronics Letters, vol. 36, no. 23, pp. 1909-1911, 2000.
• K.T. Yan, L. Forbes and S. Taylor, "A Simple Model for the Channel Noise Coefficient of FETs Including Hot Electron Effects," Microelectronics Reliability, vol. 39, no. 12, pp. 1773-1786, Dec. 1999.
• L. Forbes, M.S. Choi and W. Cao, "1/f Noise in Bipolar Transistors due to Temperature Fluctuations in Head Conduction," Microelectronics Reliability, vol. 39, no. 9, pp. 1357-1364, Sept. 1999.
  

Conference Proceedings

• C.W. Zhang, M.Y. Louie and L. Forbes, "MOSFET L/F Noise Measurement under Switched Bias Conditions," Workshop on Microelectronics and Electron Devices, Boise, Idaho, 16 April 2004, pp. 79-81.
• R. Darapu, C.W. Zhang and L. Forbes, "Analysis of Jitter in Clock Distribution Networks," Workshop on Microelectronics and Electron Devices, Boise, Idaho, 16 April 2004 , pp. 45-47.
• C.W. Zhang and L. Forbes, "Simulation of Timing Jitter in Ring Oscillators," University, Industry, Government Microelectronics Symposium, Boise, Idaho, June 2003, pp. 356-359.
• L. Forbes, X.Y. Wang, and C.W. Zhang, "Temperature Fluctuations and l/f Noise in Electron Devices," University, Industry, Government Microelectronics Symposium, Boise, Idaho, June 2003, pp. 353-355.
• L. Forbes and C.W. Zhang ,"1/F Noise and Clock Jitter in Digital Electronic Systems," Proc. 1st Int. Symp. on Fluctuations and Noise, Santa Fe, NM, 1-4 June 2003, pp. 168-180.
• L. Forbes, "Theory for Hooge's Equation Based on Temperature Fluctuations," 1st Int. Symp. on Fluctuations and Noise, Santa Fe, NM, 1-4 June 2003, pp. 435-440.
• X. Wang, C.W. Zhang and L. Forbes, "An Investigation of Timing Jitter In Bipolar ECL Ring Oscillators," Proc. 2002 Midwest Symp. on Circuits and Systems, Tulsa OK, in press.
• C.W. Zhang and L. Forbes, "Timing Jitter in a 1.35-GHZ Single-ended Ring Oscillator," Proc. 2002 Midwest Symp.on Circuits and Systems, Tulsa, OK, in press.
• L. Forbes, and I. Chandra, "New PI-Model of Bipolar Transistor Noise for Circuit Analysis and Simulation & Technique to Reduce Phase Noise in Bipolar Oscillators," Proc. 2002 Midwest Symp. On Circuits and Systems, Tulsa, OK, in press.
• L. Forbes, C. W. Zhang, B. L. Zhang and I. Chandra, "Comparison of Phase Noise Simulation Techniques on a BJT LC Oscillator," Proc. 2002 Midwest Symp. On Circuits and Systems, Tulsa, OK, in press.