ECE 428- Data Converters

Catalog Description: The functions, characterization, algorithms, architectures and implementation of A/D and D/A converters. (Listed as Data Acquisition in Schedule of Classes)

Prerequisites:

By course: ECE 323, ECE 352
By topic: Digital and analog circuits, systems and signals. Circuit analysis techniques. Time- and frequency-domain signal analysis.

Courses that require this as a prerequisite: none

Credits: 4 Terms Offered: Spring annually

Instructors:

Primary: G. Temes
Secondary: U. Moon

Textbook: Analog Integrated Circuit Design, Johns and Martin, Wiley Press, 1997, ISBN 0-471-14448-7.

References:

• Principles of Data Conversion System Design, Razavi, IEEE Press, 1995, ISBN 0-7803-1093-4.
• Delta-Sigma Data Converters, Norsworthy, Schreier, Temes, IEEE Press, 1997, ISBN 0-780-31045-4

Course Learning Objectives:
Students must demonstrate the ability to:

1. State the functions and applications of D/A and A/D converters.
   (ABET Outcomes h, i, j)
2. Describe the ideal DACs and ADCs: operation, specifications, metrics. (ABET Outcomes a, h, i, j)
3. Identify converter nonidealities: offset and gain error, DNL, INL, nonmonotonicity, missing codes: SNR, DR, SFDR, etc. (ABET Outcomes a, b, c, e)
4. Describe, analyze and design DAC architectures: decoder-type, binary, thermometer, hybrid DACs. (ABET Outcomes c, e, k)
5. Analyze and design DAC circuit structures: R-string and R-ladder, current-steering, charge-redistribution, hybrid, segmented DACs. (ABET Outcomes c, e, k)
6. Describe, analyze and design ADC architectures: integrating, successive-approximation and algorithmic, pipelined, time-interleaved, subranging and two-step, interpolating, folding and flash ADCs. (ABET Outcomes c, e, k)
7. Analyze and design ADC circuits: resistor-string, charge-redistribution, current-steering, hybrid, folding/interpolating implementations. (ABET Outcomes c, e, k)
8. Describe error correction in DACs and ADCs. (ABET Outcomes a, h, i, j)
9. Describe oversampled (delta-sigma) DACs and ADCs. (ABET Outcomes h, i, j)
10. Describe and perform the static and dynamic testing of DACs and ADCs. (ABET Outcomes a, b, j, k)

Topics

• Review of data converter operation and characterization.
• DAC architectures, structures, nonidealities.
• ADC architectures, structures, nonidealities.
• Laboratory techniques for testing data converters
• Oversampling data converters.
  

Labs

• Introduction to Labview
• Characterization of a commercial DAC
• Characterization of a commercial ADC
• Design, implementation and characterization of an ADC

Structure: Three 50-minute lectures per week; Four lab sessions during the term.

Original: 4/01
Revised: 9/01