John Conley

Professor
Electrical & Computer Engineering
Web Page: 
http://eecs.oregonstate.edu/~jconley
Education: 
  • 1995    Ph.D., Engineering Science and Mechanics
    The Pennsylvania State University, University Park, PA
  • 1991    B.S., Electrical Engineering
    The Pennsylvania State University, University Park, PA
Biography: 

John F. Conley, Jr. earned his B.S. in electrical engineering in 1991 and Ph.D. in engineering science and mechanics in 1995 from The Pennsylvania State University where he won a 1996 Xerox Prize for his Ph.D. dissertation.

He was at Dynamics Research Corporation from 1995 to 2000 and at the Jet Propulsion Laboratory from 2000-2001, where he received an achievement award. In 2001, he became a senior member of the technical staff at Sharp Laboratories of America (SLA) and from 2005-2007 was Leader of the Novel Materials and Devices Group. In 2002-03, he served as an adjunct professor at the Vancouver campus of Washington State University. Since 2007, he has been a Professor and an ONAMI Signature Faculty Fellow at Oregon State University in both the School of Electrical Engineering and Computer Science and the Intercollege Materials Science Program. His research interests include atomic layer deposition, high-κdielectrics, thin film transistors, metal/insulator/metal tunnel diodes, directed integration of nanomaterials and nanodevices, electron spin resonance identification of electrically active point defects, reliability, and radiation effects in novel electronic materials. He is a senior member of IEEE.

Dr. Conley has served as a guest editor for three special issues of IEEE Transactions on Device and Material Reliability and has served on the technical and management committees of the IEEE IRPS, the IEEE SOI Conference, and the IEEE Nuclear and Space Radiation Effects Conference, was technical program chair of the 2000 IEEE Microelectronics Reliability and Qualification Workshop, and general program chair of the 2006 IEEE International Integrated Reliability Workshop. Dr. Conley has authored or co-authored over 100 technical papers (including several invited) and over 100 conference presentations. He also holds eighteen U.S. patents and has presented tutorial short courses on high-k dielectrics at two international conferences.

Research group: 
Materials and Devices
Research Interests: 

Dr. Conley's research interests include atomic layer deposition, high-κdielectrics, thin film transistors, metal/insulator/metal tunnel diodes, directed integration of nanomaterials and nanodevices, electron spin resonance identification of electrically active point defects, reliability, and radiation effects in novel electronic materials.

Teaching: 
ECE 612 PROCESS INTEGRATION
2012
Huang, C. - C., A. D. Mason, J. F. Conley, C. Heist, M. T. Koesdjojo, V. T. Remcho, and T. Afentakis, "Impact of Parylene-A Encapsulation on ZnO Nanobridge Sensors and Sensitivity Enhancement via Continuous Ultraviolet Illumination", Journal of Electronic Materials, vol. 41, issue 5, pp. 873 - 880, 05/2012. Abstract
Alimardani, N., W. E. Cowell, J. F. Wager, J. F. Conley, D. R. Evans, M. Chin, S. J. Kilpatrick, and M. Dubey, "Impact of electrode roughness on metal-insulator-metal tunnel diodes with atomic layer deposited Al2O3 tunnel barriers", Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 30, issue 1, pp. 01A113, 01/2012. Abstract
2011
Murali, S., S. Prasertpalichat, C. C. Huang, D. Cann, R. Yimnirun, and J. F. Conley, "Conductivity Measurement of ZnO Nanowires Using the Powder-Solution-Composite Technique", Journal of The Electrochemical Society, vol. 158, issue 10, pp. G211-G216, 07/2011. Abstract
Mason, A. D., C. - C. Huang, S. Kondo, M. T. Koesdjojo, Y. H. Tennico, V. T. Remcho, and J. F. Conley, "Synthesis, functionalization, and environmental stabilization of ZnO nanobridge transducers for gas and liquid-phase sensing", Sensors and Actuators B: Chemical, vol. 155, issue 1, pp. 245 - 252, 07/2011. Abstract
Waggoner, T., J. Triska, K. Hoshino, J. F. Wager, and J. F. Conley, "Zirconium oxide-aluminum oxide nanolaminate gate dielectrics for amorphous oxide semiconductor thin-film transistors", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 29, issue 4, pp. 04D115, 07/2011. Abstract
Cowell, W. E., N. Alimardani, C. C. Knutson, J. F. Conley, D. A. Keszler, B. J. Gibbons, and J. F. Wager, "Advancing MIM Electronics: Amorphous Metal Electrodes", Advanced Materials, vol. 23, issue 1, pp. 74 - 78, 01/2011. Abstract
2010
Conley, J. F., "Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors", IEEE Transactions on Device and Materials Reliability, vol. 10, issue 4, pp. 460 - 475, 12/2010. Abstract
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Alimardani, N., J. F. Conley, E. W. Cowell, J. F. Wager, M. Chin, S. Kilpatrick, and M. Dubey, "Stability and bias stressing of metal/insulator/metal diodes", 2010 IEEE International Integrated Reliability Workshop (IIRW), S. Lake Tahoe, CA, IEEE, pp. 80 - 84, 10/2010. Abstract
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Triska, J., J. F. Conley, R. E. Presley, and J. F. Wager, "Bias stress stability of zinc-tin-oxide thin-film transistors with Al2O3 gate dielectrics", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 28, issue 4, pp. C5I1, 07/2010. Abstract
Huang, C. - C., B. D. Pelatt, and J. F. Conley, "Directed integration of ZnO nanobridge sensors using photolithographically patterned carbonized photoresist", Nanotechnology, vol. 21, issue 19, pp. 195307, 05/2010. Abstract
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2009
Smith, S. W., K. G. McAuliffe, and J. F. Conley, "Atomic Layer Deposited Al2O3/Ta2O5 Nanolaminate Capacitors", 2009 International Semiconductor Device Research Symposium (ISDRS), College Park, MD, IEEE, pp. 1 - 2, 12/2009. Abstract
Pelatt, B. D., C. - C. Huang, and J. F. Conley, "ZnO Nanobridge Devices Fabricated on Carbonized Photoresist", 2009 International Semiconductor Device Research Symposium (ISDRS), College Park, MD, IEEE, pp. 1 - 2, 12/2009. Abstract
2006
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2005
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Conley, J. F., L. Stecker, and Y. Ono, "Directed Integration of ZnO Nanobridge Devices on a Si Substrate", Applied Physics Letters, vol. 87, issue 22, pp. 223114, 11/2005. Abstract
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Lenahan, P. M., and J. F. Conley, "Magnetic Resonance Studies of Trapping Centers in High-κ Dielectric Films on Silicon", IEEE Transactions on Device and Materials Reliability, vol. 5, issue 1, pp. 90 - 102, 03/2005. Abstract
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2004
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