John Conley

Professor
Electrical & Computer Engineering
Education: 
  • 1995    Ph.D., Engineering Science and Mechanics
    The Pennsylvania State University, University Park, PA
  • 1991    B.S., Electrical Engineering
    The Pennsylvania State University, University Park, PA
Biography: 

John F. Conley, Jr. earned his B.S. in electrical engineering in 1991 and Ph.D. in engineering science and mechanics in 1995 from The Pennsylvania State University where he won a 1996 Xerox Prize for his Ph.D. dissertation.

He was at Dynamics Research Corporation from 1995 to 2000 and at the Jet Propulsion Laboratory from 2000-2001, where he received an achievement award. In 2001, he became a senior member of the technical staff at Sharp Laboratories of America (SLA) and from 2005-2007 was Leader of the Novel Materials and Devices Group. In 2002-03, he served as an adjunct professor at the Vancouver campus of Washington State University. Since 2007, he has been a Professor and an ONAMI Signature Faculty Fellow at Oregon State University in both the School of Electrical Engineering and Computer Science and the Intercollege Materials Science Program. His research interests include atomic layer deposition, high-κdielectrics, thin film transistors, metal/insulator/metal tunnel diodes, directed integration of nanomaterials and nanodevices, electron spin resonance identification of electrically active point defects, reliability, and radiation effects in novel electronic materials. He is a senior member of IEEE.

Dr. Conley has served as a guest editor for three special issues of IEEE Transactions on Device and Material Reliability and has served on the technical and management committees of the IEEE IRPS, the IEEE SOI Conference, and the IEEE Nuclear and Space Radiation Effects Conference, was technical program chair of the 2000 IEEE Microelectronics Reliability and Qualification Workshop, and general program chair of the 2006 IEEE International Integrated Reliability Workshop. Dr. Conley has authored or co-authored over 100 technical papers (including several invited) and over 100 conference presentations. He also holds eighteen U.S. patents and has presented tutorial short courses on high-k dielectrics at two international conferences.

Research group: 
Research Interests: 

Dr. Conley's research interests include atomic layer deposition, high-κdielectrics, thin film transistors, metal/insulator/metal tunnel diodes, directed integration of nanomaterials and nanodevices, electron spin resonance identification of electrically active point defects, reliability, and radiation effects in novel electronic materials.

2012
2011
Murali, S., J. S. Rajachidambaram, S. - Y. Han, C. - H. Chang, G. S. Herman, and J. F. Conley, "Bipolar resistive switching of zinc-tin-oxide resistive random access memory", IEEE 11th International Conference on Nanotechnology (IEEE-NANO), Portland, OR, IEEE, pp. 740 - 743, 08/2011. Abstract
Waggoner, T., J. Triska, K. Hoshino, J. F. Wager, and J. F. Conley, "Zirconium oxide-aluminum oxide nanolaminate gate dielectrics for amorphous oxide semiconductor thin-film transistors", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 29, issue 4, pp. 04D115, 07/2011. Abstract
2010
Conley, J. F., "Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors", IEEE Transactions on Device and Materials Reliability, vol. 10, issue 4, pp. 460 - 475, 12/2010. Abstract
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Alimardani, N., J. F. Conley, E. W. Cowell, J. F. Wager, M. Chin, S. Kilpatrick, and M. Dubey, "Stability and bias stressing of metal/insulator/metal diodes", 2010 IEEE International Integrated Reliability Workshop (IIRW), S. Lake Tahoe, CA, IEEE, pp. 80 - 84, 10/2010. Abstract
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Triska, J., J. F. Conley, R. E. Presley, and J. F. Wager, "Bias stress stability of zinc-tin-oxide thin-film transistors with Al2O3 gate dielectrics", Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 28, issue 4, pp. C5I1, 07/2010. Abstract
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2009
Smith, S. W., K. G. McAuliffe, and J. F. Conley, "Atomic Layer Deposited Al2O3/Ta2O5 Nanolaminate Capacitors", 2009 International Semiconductor Device Research Symposium (ISDRS), College Park, MD, IEEE, pp. 1 - 2, 12/2009. Abstract
Mason, A. D., T. F. Roberts, J. F. Conley, D. T. Price, D. D. J. Allman, and M. S. McGuire, "Investigation of growth parameter influence on hydrothermally grown ZnO nanowires using a research grade microwave", 2009 IEEE International Semiconductor Device Research Symposium (ISDRS), College Park, MD, IEEE, pp. 1 - 2, 12/2009. Abstract
Pelatt, B. D., C. - C. Huang, and J. F. Conley, "ZnO Nanobridge Devices Fabricated on Carbonized Photoresist", 2009 International Semiconductor Device Research Symposium (ISDRS), College Park, MD, IEEE, pp. 1 - 2, 12/2009. Abstract
Triska, J., J. F. Conley, R. Presley, and J. F. Wager, "Bias Stability of Zinc-Tin-Oxide Thin Film Transistors with Al2O3 Gate Dielectrics", IEEE International Integrated Reliability Workshop (IRW), South Lake Tahoe, CA, IEEE, pp. 86 - 89, 10/2009. Abstract
Conley, J. F., "Instabilities in oxide semiconductor transparent thin film transistors", 2009 IEEE International Integrated Reliability Workshop (IRW), South Lake Tahoe, CA, IEEE, pp. 50 - 55, 10/2009. Abstract
2006
Green, J. M., T. Gutu, L. Dong, J. Jiao, J. F. Conley, and Y. Ono, "Electron Microscopy Characterization of Al2O3 and ZnO Coated Carbon Nanotubes", Microscopy and Microanalysis, vol. 12, issue S02, pp. 676-677, 08/2006.
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Goncher, G., R. Solanki, J. R. Carruthers, J. F. Conley, and Y. Ono, "p-n junctions in silicon nanowires", Journal of Electronic Materials, vol. 35, issue 7, pp. 1509 - 1512, 07/2006. Abstract