John F. Wager
In Press
Yeh, B., and J. F. Wager,
"Interface state estimation of thin-film transistors with amorphous oxide semiconductor channel layers",
J. Appl. Phys, In Press.
2012
Cowell, W. E., C. C. Knutson, N. A. Kuhta, W. Stickle, D. A. Keszler, and J. F. Wager,
"Engineering anisotropic dielectric response through amorphous laminate structures",
Physica Status Solidi (a), vol. 209, issue 4, pp. 777 - 784, 04/2012.
Abstract
Alimardani, N., W. E. Cowell, J. F. Wager, J. F. Conley, D. R. Evans, M. Chin, S. J. Kilpatrick, and M. Dubey,
"Impact of electrode roughness on metal-insulator-metal tunnel diodes with atomic layer deposited Al2O3 tunnel barriers",
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 30, issue 1, pp. 01A113, 01/2012.
Abstract
Lany, S., A. Zakutayev, T. Mason, J. F. Wager, K. Poeppelmeier, J. Perkins, J. Berry, D. Ginley, and A. Zunger,
"Surface Origin of High Conductivities in Undoped In_{2}O_{3} Thin Films",
Physical Review Letters, vol. 108, issue 1, 01/2012.
Abstract
2011
Wager, J. F., and J. Robertson,
"Metal-induced gap states modeling of metal-Ge contacts with and without a silicon nitride ultrathin interfacial layer",
Journal of Applied Physics, vol. 109, issue 9, pp. 094501, 2011.
Abstract
Pelatt, B. D., R. Ravichandran, J. F. Wager, and D. A. Keszler,
"Atomic Solid State Energy Scale",
Journal of the American Chemical Society, vol. 133, issue 42, pp. 16852 - 16860, 10/2011.
Abstract
Yu, L., S. Lany, R. Kykyneshi, V. Jieratum, R. Ravichandran, B. Pelatt, E. Altschul, H. A. S. Platt, J. F. Wager, D. A. Keszler, et al.,
"Iron Chalcogenide Photovoltaic Absorbers",
Advanced Energy Materials, vol. 1, issue 5, pp. 748 - 753, 10/2011.
Abstract
Waggoner, T., J. Triska, K. Hoshino, J. F. Wager, and J. F. Conley,
"Zirconium oxide-aluminum oxide nanolaminate gate dielectrics for amorphous oxide semiconductor thin-film transistors",
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 29, issue 4, pp. 04D115, 07/2011.
Abstract
Wager, J. F., and R. Hoffman,
"Thin, Fast, and Flexible: amorphous oxide semiconductors promise to makes flat-panel displays faster and sharper than today’s silicon standby",
IEEE Spectrum, pp. 42-45, 51-56, 05/2011.
Jiang, K., J. T. Anderson, K. Hoshino, D. Li, J. F. Wager, and D. A. Keszler,
"Low-Energy Path to Dense HfO2 Thin Films with Aqueous Precursor",
Chemistry of Materials, vol. 23, issue 4, pp. 945 - 952, 02/2011.
Abstract
Cowell, W. E., N. Alimardani, C. C. Knutson, J. F. Conley, D. A. Keszler, B. J. Gibbons, and J. F. Wager,
"Advancing MIM Electronics: Amorphous Metal Electrodes",
Advanced Materials, vol. 23, issue 1, pp. 74 - 78, 01/2011.
Abstract
Wager, J. F.,
"Oxide Thin-Film Transistors",
Handbook of Visual Display Technology, vol. 1, 2011.
2010
Alimardani, N., J. F. Conley, E. W. Cowell, J. F. Wager, M. Chin, S. Kilpatrick, and M. Dubey,
"Stability and bias stressing of metal/insulator/metal diodes",
2010 IEEE International Integrated Reliability Workshop (IIRW), S. Lake Tahoe, CA, IEEE, pp. 80 - 84, 10/2010.
Abstract
Wager, J. F.,
"Transfer-curve assessment of oxide thin-film transistors",
Journal of the Society for Information Display, vol. 18, issue 10, pp. 749–752, 10/2010.
Abstract
Hoshino, K., and J. F. Wager,
"Operating Temperature Trends in Amorphous In–Ga–Zn–O Thin-Film Transistors",
IEEE Electron Device Letters, vol. 31, issue 8, pp. 818 - 820, 08/2010.
Abstract
Cowell, III, W. E., C. C. Knutson, J. F. Wager, and D. A. Keszler,
"Amorphous Metal/Oxide Nanolaminate",
ACS Applied Materials & Interfaces, vol. 2, issue 7, pp. 1811 - 1813, 07/2010.
Abstract
Triska, J., J. F. Conley, R. E. Presley, and J. F. Wager,
"Bias stress stability of zinc-tin-oxide thin-film transistors with Al2O3 gate dielectrics",
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, vol. 28, issue 4, pp. C5I1, 07/2010.
Abstract
McFarlane, B. R., P. Kurahashi, D. P. Heineck, R. E. Presley, E. S. Sundholm, and J. F. Wager,
"AC/DC Rectification With Indium Gallium Oxide Thin-Film Transistors",
IEEE Electron Device Letters, vol. 31, issue 4, pp. 314 - 316, 04/2010.
Abstract
2009
Erslev, P. T., E. S. Sundholm, R. E. Presley, D. Hong, J. F. Wager, and D. J. Cohen,
"Mapping out the distribution of electronic states in the mobility gap of amorphous zinc tin oxide",
Applied Physics Letters, vol. 95, issue 19, pp. 192115, 2009.
Abstract
Spies, J. A., R. Schafer, J. F. Wager, P. A. Hersh, H. A. S. Platt, D. A. Keszler, G. Schneider, R. Kykyneshi, J. Tate, and X. Liu,
"pin double-heterojunction thin-film solar cell p-layer assessment",
Solar Energy Materials and Solar Cells, vol. 93, issue 8, pp. 1296 - 1308, 08/2009.
Abstract
Wager, J. F.,
"Invited Paper: Amorphous Oxide Semiconductor Thin-Film Transistors: Performance & Manufacturability for Display Applications",
SID Symposium Digest of Technical Papers, vol. 40, issue 1, pp. 181-183, 06/2009.
Abstract
Wager, J. F.,
"Invited Paper: Amorphous Oxide Semiconductor Thin-Film Transistors: Performance & Manufacturability for Display Applications",
SID Symposium Digest of Technical Papers, vol. 40, issue 1, pp. 181, 06/2009.
Abstract
Hoshino, K., D. Hong, H. Q. Chiang, and J. F. Wager,
"Constant-Voltage-Bias Stress Testing of a-IGZO Thin-Film Transistors",
IEEE Transactions on Electron Devices, vol. 56, issue 7, pp. 1365 - 1370, 05/2009.
Abstract
Heineck, D. P., B. R. McFarlane, and J. F. Wager,
"Zinc Tin Oxide Thin-Film-Transistor Enhancement/Depletion Inverter",
IEEE Electron Device Letters, vol. 30, issue 5, pp. 514 - 516, 05/2009.
Abstract
Contact Information
John
Wager
4091 Kelley Engineering Center
Corvallis, OR 97331-5501
(541) 737-2994
(541) 737-1300






